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14.11. Testing memories: stuck at u0026 transition faults (Electron Tube) View |
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14.12. Testing memories: coupling u0026 NPSF (Electron Tube) View |
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Memory Faults | Stuck at Fault | Transition | Coupling | Pattern sensitive | Ram Faults | DFT VLSI (Concept DFT) View |
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MBIST | Memory Testing | March Algorithm | DFT (Mallesh_DFT) View |
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3 2 FaultModeling SSF (李建模(James CM Li)) View |
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Memory Testing Algorithms | MATS | MATS+ | MATS 2 | MATS++ | MARCH X | MARCH C | MARCH C- | VLSI DFT (Concept DFT) View |
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11 5 DFT1 ClockScan (*optional) (李建模(James CM Li)) View |
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Transition faults | launch on shift | launch on capture | LOS | LOC (Mallesh_DFT) View |
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AAA: Automated, On-ATE AI Debug of Scan Chain Failures (ACTL CMU) View |
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ADHD, Executive Functioning, and Experiential Education (AttentionTalkVideo) View |