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Ceramic sample polishing (1st part TEM sample preparation) (Microelectronics Research Unit Oulu) View |
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Metallography Part II - Microscopic Techniques (MaterialsScience2000) View |
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Sample preparation: -surface polishing (Magnus Hummelgård) View |
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10 - TEM specimen preparation (Kelvin Xie MSEN TAMU) View |
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Focused Ion Beam (FIB) (2nd part TEM sample preparation) (Microelectronics Research Unit Oulu) View |
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Gatan 656 Dimple Grinder #61790 (Bid Servicellc) View |
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Metallography Machine Range (Metallographic Preparation) (Kemet International Limited) View |
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Allied High Tech Techprep Polisher #63031 (Bid Servicellc) View |
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Sample Preparation for TEM (Transmission Electron Microscopy) (Microelectronics Research Unit Oulu) View |
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[Amended] Sample Mounting for Nanoindentation (Part 1) (Hopkins Materials) View |